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US Patent Issued to DarkVision Technologies on Sept. 8 for "Method and system for characterizing perforations in a tubular" (Canadian, American Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,235, issued on Sept. 8, was assigned to DarkVision Technologies Inc. "Method and system for characterizing perforations in a tubular" was i... Read More


US Patent Issued to Korea Advanced Institute of Science and Technology on Sept. 8 for "Method of measuring structure displacement based on fusion of asynchronous vision measurement data of natural target and acceleration data of structure, and system for the same" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,236, issued on Sept. 8, was assigned to Korea Advanced Institute of Science and Technology (Daejeon, South Korea). "Method of measuring str... Read More


US Patent Issued to HAMAD MEDICAL on Sept. 8 for "System and method for facial mask detection and disinfection for reuse" (Qatari Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,237, issued on Sept. 8, was assigned to HAMAD MEDICAL Corp. (Doha, Qatar). "System and method for facial mask detection and disinfection fo... Read More


US Patent Issued to Schlumberger Technology on Sept. 8 for "Panoramic images for improved methane camera commissioning, interpretation, and remote operation" (American, British Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,238, issued on Sept. 8, was assigned to Schlumberger Technology Corp. (Sugar Land, Texas). "Panoramic images for improved methane camera co... Read More


US Patent Issued to KLA on Sept. 8 for "Digital nonlinear neural network based image filtering for semiconductor applications" (California Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,239, issued on Sept. 8, was assigned to KLA Corp. (Milpitas, Calif.). "Digital nonlinear neural network based image filtering for semicondu... Read More


US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY on Sept. 8 for "Method, apparatus, and device for testing adhesive tape pasted onto surface of electrode plate, and machine for pasting adhesive tape onto electrode plate" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,240, issued on Sept. 8, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY Co. Ltd. (Ningde, China). "Method, apparatus, and device for testin... Read More


US Patent Issued to Tokyo Electron on Sept. 8 for "Information processing method, information processing apparatus, and storage medium" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,241, issued on Sept. 8, was assigned to Tokyo Electron Ltd. (Tokyo). "Information processing method, information processing apparatus, and ... Read More


US Patent Issued to KONICA MINOLTA on Sept. 8 for "Determination-area decision method, computer-readable recording medium storing program, and component feeding apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,242, issued on Sept. 8, was assigned to KONICA MINOLTA INC. (Tokyo). "Determination-area decision method, computer-readable recording mediu... Read More


US Patent Issued to SEMES on Sept. 8 for "Nozzle inspection unit and substrate treatment apparatus including the same" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,243, issued on Sept. 8, was assigned to SEMES Co. LTD. (Chungcheongnam-do, South Korea). "Nozzle inspection unit and substrate treatment ap... Read More


US Patent Issued to Canon on Sept. 8 for "Inspection system and method for controlling inspection system" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,244, issued on Sept. 8, was assigned to Canon K.K. (Tokyo). "Inspection system and method for controlling inspection system" was invented b... Read More